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Reference Terms
from Wikipedia, the free encyclopedia

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Transmission electron microscopy

Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film, or to be detected by a CCD camera.

In the past, light microscopes have been used mostly for imaging due to their relative ease of use.

However, the maximum resolution that one can image is determined by the wavelength of the photons that are being used to probe the sample.

In the early days of microscopy nothing smaller than the wavelength being used could be resolved, whereas nowadays the law of RESOLFT sets the limit for optical microscopes employing such concepts.

Note:   The above text is excerpted from the Wikipedia article "Transmission electron microscopy", which has been released under the GNU Free Documentation License.
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